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Registration Number

0214U002254, 0113U000225 , R & D reports

Title

Origination of the scanning probe microscopy laboratory

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Head

Prokopenko Igor,

Registration Date

27-01-2014

Organization

Institute of Semiconductor Physics of National Academy of Sciences of Ukrain

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Techniques for calibration of the AFM probes force constants were developed and tested. Different physical approaches, both stationary and dynamic modes, used. A corresponding analysis of measurement uncertainties and calibration of sets of AFM probes with elastic constants in the range of 0.2 - 50 N / m fulfilled.

Product Description

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Єфремов О.О.
Корчовий А.А.
Литвин О.С.
Литвин П.М.
Прокопенко І.В.

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2020-04-02