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Information × Registration Number 0110U005776, ( 0214U008465  ) R & D request Title The creation of X-ray diffracto-topograph-reflectometer for skew-antisymmetric geometry of diffraction with taking into account the diffuse scattering and profiled surface roughness, in particular, on grazing rays for nondestructive, selective in depth and multiprojection diagnosis of nanotechnology products Head Кисловський Євген Миколайович, Registration Date 14-10-2010 Organization G. V. Kurdyumov IMPh of the N.A.S.U. popup.description1 popup.nrat_date 2024-12-10 Close
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The creation of X-ray diffracto-topograph-reflectometer for skew-antisymmetric geometry of diffraction with taking into account the diffuse scattering and profiled surface roughness, in particular, on grazing rays for nondestructive, selective in depth and multiprojection diagnosis of nanotechnology products
Head: Кисловський Євген Миколайович. The creation of X-ray diffracto-topograph-reflectometer for skew-antisymmetric geometry of diffraction with taking into account the diffuse scattering and profiled surface roughness, in particular, on grazing rays for nondestructive, selective in depth and multiprojection diagnosis of nanotechnology products. G. V. Kurdyumov IMPh of the N.A.S.U.. № 0110U005776
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Updated: 2026-03-21


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