1 documents found
Head: Неміш Іван Юрійович. Investigation of characteristics of cryogenic temperatures microsensors based on silicon transistor structures for study of possibility of metrological characteristics standardization.
State Enterprise "Special design and technological bureau with experimental production of V.Lashkarev Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine". № 0111U004968
1 documents found
Updated: 2026-03-26
