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Information × Registration Number 0113U005489, ( 0213U004618  0213U006648  ) R & D request Title The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation Head Фодчук Ігор Михайлович, Registration Date 09-07-2013 Organization Yuriy Fedkovych Chernivtsi National University popup.description1 popup.nrat_date 2024-12-10 Close
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The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation
Head: Фодчук Ігор Михайлович. The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation. Yuriy Fedkovych Chernivtsi National University. № 0113U005489
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Updated: 2026-03-22


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