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Information × Registration Number 0118U006693, R & D request Title Production of the test structures and plates with Gunn diode chips of the terahertz range based on GaAs epitaxial structures of the n-n+ -type. Head Круковський Семен Іванович, Registration Date 27-12-2018 Organization Scientific Research Company "Electron-Carat"-Branch of Private Joint Stock Company "Concern-Electron" popup.description1 popup.nrat_date 2024-12-10 Close
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Production of the test structures and plates with Gunn diode chips of the terahertz range based on GaAs epitaxial structures of the n-n+ -type.
Head: Круковський Семен Іванович. Production of the test structures and plates with Gunn diode chips of the terahertz range based on GaAs epitaxial structures of the n-n+ -type.. Scientific Research Company "Electron-Carat"-Branch of Private Joint Stock Company "Concern-Electron". № 0118U006693
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Updated: 2026-03-26


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