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Information × Registration Number 0119U100731, ( 0222U000768  ) R & D request Title New approaches in the development of structural-sensitive X-ray spectrometry and diffractometry of complex crystalline compounds, thin film and nanosized layered systems Head Fodchuk Ihor M., Доктор фізико-математичних наук Registration Date 17-02-2019 Organization Yuriy Fedkovych Chernivtsi National University popup.description1 The development on a new level of the concept of multi-level approach to the creation of new methods of non-destructive structural-sensitive X-ray diagnostics of structural changes in solid solutions withcomplex crystalline structure, thin films and multilayered nanosized systems, as well as in near-surface layers of semiconductors exposed to external influences popup.nrat_date 2024-12-10 Close