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Information × Registration Number 0121U111717, ( 0222U000616  0223U001013  ) R & D request Title Quasioptical scale modeling of the influence of radiation-induced localized defects in metals and alloys on the optical ellipsometry data Head Kolenov Ivan V., Registration Date 20-06-2021 Organization Institute of Electrophysics and Radiation Technologies of the National Academy of Sciences of Ukraine popup.description1 The work aims to create and test a method of scale modeling of the influence of radiation-induced rough surfaces (localization defects) at the millimeter size level using a sub-THz quasioptical ellipsometer, which will experimentally verify the adequacy of the choice of the ellipsometric surface model. popup.nrat_date 2024-12-09 Close