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Information × Registration Number 0123U103149, ( 0224U000484  0225U000518  ) R & D request Title Passivation of single-crystal Cd(Zn)Te with diamond-like alpha-C:H:N coatings for X- and gamma-radiation detectors Head Malyi Yevhen V., Кандидат фізико-математичних наук Registration Date 07-07-2023 Organization National Academy of Sciences of Ukraine popup.description1 Semiconductor detectors are promising for the registration of various types of radiation and particles. At this, radiation and counting characteristics and their dependence on the intensity and energy of particles and radiation are played an important role. In turn, the radiation characteristics depend on the design and technological parameters of the semiconductor material of the detector. Cadmium zinc telluride (CZT) has shown great promise as a material to be used for the production of X-ray and gamma-ray detectors operating at room temperature and producing current flow under the influence of a gate voltage, upon exposure to high energy radiation The performance of detectors fabricated from CZT is often limited by the leakage current in the devices. Surface passivation is an effective technique for controlling this parameter and its related electronic noise.Diamond-like carbon (DLC) film is an amorphous material that consists of sp2 and sp3 hybridized carbon with structure equivalent to the graphite and to the diamond respectively, and of hydrogen. DLC films have superior properties such as high hardness, IR transparency, low friction coefficient, chemical inertness and gas barrier, and are used widely as coating materials in various industrial fields. In general, DLC films have very strong tolerance for X-ray irradiation Because of its extreme properties DLC films were proposed for a wide variety of electronic applications involving an effective physical passivation material for radiation detectors. Some of these applications are based on the radiation hardness of diamond. By virtue of its bond strengths, DLC should be much more resistant to radiation damage than silicon. We expect that passivation of the CZT crystal surface with DLC films can allow us to obtain Cd(Zn)Te - X/gamma detectors with low leakage current, high energy resolution and stability of the functional characteristics. popup.nrat_date 2024-12-09 Close