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Information × Registration Number 0200U001878, 0198U002317 , R & D reports Title Working our the complex method of thin films micromechanical properties characterization by means of scanning tunneling microscopy and acoustic emission popup.stage_title Head Novykov M.V., Registration Date 06-04-2000 Organization V.Bakul Institute for Superhard Materials popup.description2 The idea to use the scanning tunneling microscope for thin films hardness measurement was proposed. The technique to control the process of indentation was working out. Deformation curves at point loading of silicon carbide, boron carbide and cubic boron nitride were obtained. Product Description popup.authors popup.nrat_date 2020-04-03 Close