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Information × Registration Number 0204U005517, 0104U010366 , R & D reports Title Influence of defects in monochromator on diffraction reflection curves of the high-resolution double-crystal diffractometer popup.stage_title Head Molodkin Vadim Borysovych, Registration Date 16-12-2004 Organization Institute for metal physics NAS Ukkraine popup.description2 The theoretical model of X-ray diffraction in the high-resolution double-crystal diffractometer (DCD) has been developed with account for diffuse scattering effects from defects in monochromator crystals. Their essential influence on the instrumental function of DCD has been demonstrated. The comparative analysis of characterization results for defects in various single crystals has been carried out both with and without taking these effects into account, which has shown necessity of their account for adequate quantitative diagnostics. Product Description popup.authors popup.nrat_date 2020-04-02 Close