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Information × Registration Number 0205U000780, 0101U003414 , R & D reports Title Development of physical and chemical principles of creation amorphous-crysyal films structures on base of refractory borides and silisides, methods of regularities of it's structures impurities content and performances. popup.stage_title Head Dvorina L. A., Registration Date 10-02-2005 Organization Frantzevich Insitute for Materials Science Problems of the Ukranian National Academy of Sciences popup.description2 By using transmission electron microscopy and computer analysis, linear and volume parameters of microstructure of thin films consisting of the crystalline and amorphous phases are studied. The results of experiments are processed within the kinetic theory of diffusion coalescence. The total electrical resistivity of a thin amorphous-crystalline film is presented by three terms. The term of composite resistivity is obtained by solving the Odelevsky equation. It is shown that both the concentration of crystallites and microstructure morphology can greably enhance the resistivity of amorphous-crystalline films. Product Description popup.authors popup.nrat_date 2020-04-02 Close