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Information × Registration Number 0205U002772, 0103U002142 , R & D reports Title Development of high-performance method and technology of near-field scanning microwave microscopy for nanoelectronics. popup.stage_title Head Slipchenko Nikolai Ivanovich, Registration Date 23-05-2005 Organization Kharkov National Universitet of Radioelectronics. popup.description2 New methods and means of microwave microscopy for local non-destructive micro-diagnostics of the fundamental material properties (a microrelief, an impedance, surface resistance, dielectric permeability, lifetime and mobility of charge carriers, etc.), directed on their resolution and metrological efficiency increase are developed. The model sample of a microwave microscope is created. Product Description popup.authors popup.nrat_date 2020-04-02 Close