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Information × Registration Number 0206U002674, 0104U002436 , R & D reports Title Analysis of surface feature dependences of near-surface layers in disordered systems on their optical properties popup.stage_title Head Vasiliy D. Karpusha, Registration Date 17-02-2006 Organization Sumy State University popup.description2 In the present paper the possibility of application of spectral ellipsometry method for determination of parameters of near-surface layers amorphous metallic alloys is analysed. The selection criterion of incorrect solutions to inverse ellipsometry task based on the assessment of the maximal deviation determined parameters that are caused by an error of the method is suggested. The dependences of an optical thickness and temperature of a crystallization on the type of different admixture material is identified. It is experimentally revealed that during the plastic deformation of the amorphous alloy its physical properties tend to change towards the properties of the alloys of crystal structure that in its turn allow us to suggest the presence of crystal case in the amorphous matrix. Product Description popup.authors popup.nrat_date 2020-04-02 Close