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Information × Registration Number 0207U000834, 0103U002592 , R & D reports Title Dynamical X-ray scattering in multilayer structures containing quantum wells popup.stage_title Head Raransky Mykola Dmytrovych, Registration Date 09-02-2007 Organization Yuri Fedkovych Chernivtsi National University popup.description2 The model of process of self-consistency multiple coherent and diffuse X-ray scattering in structural imperfect single crystal layers and multilayer systems containing chaotically dis-tributed microdefects and point defects has been created. The change dynamics of concentra-tion and microdefect sizes in silicon crystals before and after irradiation by high energy elec-trons has been investigated. It has been established that concentration growth of discoid clus-ters and diclocation loops is accompanied by concentration decrease of small spherical clus-ters, and vice-versa. The mechanisms and dynamics of structural changes taking place in subsurface layers of CdTe single crystals and CdхHg1-хTe epitaxial structures after implanta-tion by arsenic ions have been fully investigated. Product Description popup.authors popup.nrat_date 2020-04-02 Close