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Information × Registration Number 0207U002658, 0106U010035 , R & D reports Title Theoretical analysis of X-ray diffuse scattering in complex systems with ordered defect structure popup.stage_title Head Kyslovskyy Yevgen Mykolayovych, Registration Date 07-02-2007 Organization Institute of Metal Physic G.V.Kurdyumov NAS of the Ukraine popup.description2 Recurrence relations for amplitudes of coherent waves in multilayered structure with defects have been derived and the expression for the diffuse component of reflection coefficient of this structure has been obtained with taking into account the intensity redistribution of transmitted and diffracted coherent waves in each layer. The derived formulas have been applied to analyze the rocking curves of multilayered structure with InGaAsN quantum well before and after rapid thermal annealing. Layer thicknesses and chemical compositions as well as strains and concentration profiles of chemical elements in layers, which have been formed due to segregation and interdiffusion processes, have been found. Characteristics of microdefects (clusters and dislocation loops) in all layers have been determined. Product Description popup.authors popup.nrat_date 2020-04-02 Close