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Information × Registration Number 0207U008301, 0107U003873 , R & D reports Title X-ray diffractometry of the nanoscale defects in crystals and multilayer heterosystems popup.stage_title Head Fedortsov Dmytro Georgiyoych, Registration Date 06-12-2007 Organization Yuri Fedkovych Chernivtsi National University popup.description2 The simulation of X-ray topographic images of deformation fields of dislocation loops and barriers depending on theirs space location for the thin and thick crystals has been conducted. The processes, which occur in the interfaces of multilayer nanoscale heterosystems with quantum wells, have been investigated. Product Description popup.authors popup.nrat_date 2020-04-02 Close