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Information × Registration Number 0211U008220, 0110U004656 , R & D reports Title Development of theoretical model of X-ray ultra-acoustic integral dynamic diffraction in Laue geometry under anomalous high contribution of the diffuse scattering component, giving quantative character of multiparametric diagnostic. popup.stage_title Head Olikh Jaroslav Mykhaylovych, Registration Date 19-04-2011 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 The model of X-ray-ultra-acoustic integral dinamic theory of diffraction in Laue geometry under anomalous high contribution of the diffuse scattering component is developed. It was established that the most information in case of integral diagnostic of defects characteristics is obtained in region of K-edge due to the significant difference between waves on different sides of K-edge with close wavelength caused by competition of relevant deformation dependencies. Product Description popup.authors Єфанов Олександр Миколайович Гудименко Олександр Йосипович Кладько Василь Петрович Кучук Андріан Володимирович МаксименкоЗоя Василівна Мачулін Володимир Федорович Проскуренко Наталія Миколаївна Сафрюк Надія Володимирівна Стадник Олександр Анатолійович popup.nrat_date 2020-04-02 Close