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Information × Registration Number 0211U013215, 0110U005701 , R & D reports Title Development of new method of measurement of thermal kinetic coefficients of film structures, fabrication and investigation of thermal conductivity of nanothickness multilayer film structures, testing of theoretical models. popup.stage_title Head Nikolayenko Yuriy Makarovich, Registration Date 11-01-2012 Organization A.A. Galkin Physics and Engineering Institute of National Academy of Science of the Ukraine popup.description2 Objects of investigation are multilayer film structures on the basis of the manganite solid solution. Objects of investigation are multilayer film structures on the basis of the manganite solid solution. The work purpose is the fabrication and investigation of transverse thermal conductivity of multilayer structures. The method of investigation is our non-stationary method for control of the suite of thermal kinetic coefficients in film structure (See our report 2010). Two type of multilayer heterostructures were fabricated with a different layers quantity and with relatively thick (200 nm) LSMO film layer on the top of structure. It was shown, for heterostructures with interleave thin (20 nm) layers of LSMO and CNx materials, the thermal resistance of multilayer structure is equal basically to the sum of thermal resistance of interfaces. We have showed, diffused interfaces, as well as 20-100 nm thick layers of using materials, have relatively small thermal resistance. The details of thin film layers technology and the method of oxygen content control in the epitaxial LSMO film are considered. Product Description popup.authors Артемов А.М. Кузовлев Ю.Є. Медведєв Ю.В. Самольотов О.О. Філіпов О.Е. popup.nrat_date 2020-04-02 Close