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Information × Registration Number 0212U004888, 0111U003120 , R & D reports Title High resolution Raman, nanoprobe and radiospectroscopical diagnostic of morfological, componential, structural and electrophysical properties of various nanostructures: carbonic, semiconducting, composite, colloidal and biological. popup.stage_title Head Prokopenko Igor V.; Valakh M. Ya., Registration Date 07-02-2012 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 The dependence of structural and electro-physical properties of silicon nanowhiskers on growth parameters has been investigated. It was shown the possibility of spontaneous formation and cubic/hexagonal phases of silicon coexistence in a single crystal as well as its dependence on topometrical characteristics of the crystals. The observed dependencies give a control over nanomaterial parameters and open the way to newest devices development. Product Description popup.authors Ворощенко А.Т. Клімовська А.І. Литвин О.С. Литвин П.М. Ніколенко А.С. Педченко Ю.М. Прокопенко І.В. Стрельчук В.В. Шаніна Б.Д. popup.nrat_date 2020-04-02 Close