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Information × Registration Number 0212U008794, 0112U005410 , R & D reports Title The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation popup.stage_title Head Fodchuk Igor Mychailovych, Доктор фізико-математичних наук Registration Date 02-01-2013 Organization Yuri Fedkovych Chernivtsi National University popup.description2 The methods of quantitative diagnosis of structural transformation defective system and the features of formation of diffraction reflection curves and isodiffuse intensity maps obtained by multiple crystals diffractometry after ion implantation of high-nitrogen film iron garnet. The algorithm and software for data processing experiments with structural diagnostics of ultrathin layers of single crystals before and after ion implantation and heterophase boundaries Product Description popup.authors Борча Мар'яна Драгошівна Довганюк Володимир Васильович Заплітний Руслан Анатолійович Каземірський Тарас Анатолійович Лоренц Василь Мірчович Молодкін Вадим Борисович Польовий Віктор Павлович Федорцов Дмитро Георгійович popup.nrat_date 2020-04-02 Close
R & D report
The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation
Head: Fodchuk Igor Mychailovych. The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation. (popup.stage: ). Yuri Fedkovych Chernivtsi National University. № 0212U008794
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Updated: 2026-03-24


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