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Information × Registration Number 0213U002934, 0110U005722 , R & D reports Title The methods and computer based equipment developement for nanocrystal memory samples diagnostics. popup.stage_title Head Nazarov Olexiy Mykolayovich, Registration Date 15-02-2013 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 Research object - heterocyclic, SiO2 (Si) / Si, Si/SiO2/Si, nanoclusters, nanocrystals, metrology .. aim - aim is to develop methods of diagnosing electrical items of nonvolatile nanomemory, where the floating silicon gate is used nanoclusters and nanostructures, and the creation of specialized diagnostic equipment with the original software for electrophysical investigations. Design for such research, and testing software and hardware complex for nonvolatile memory capacitance cells with nanoclusters and special transistor structures. On the third phase of the project the experimental methods of determination of the relaxation characteristics were developed. The methods cover the charge change in nanocluster memory cells during reprogramming in different modes. For measurements of the memory structures were used different modes provided by the pre-designed measurement algorithms. In particular, completion of the program control heater in the holder designs. Using thermal and optical effects on the measured samples allowed to fully investigate the relaxation properties of selected memory structures. The software has been created based on National Instruments LabView software pack tried on working with experimental system with structures of distributed nanoinclusions in silicon dielectric layer. For proper operation of the units and software enforced stress testing and debugging of real structures with pre-known parameters. SILICON, heterostructures, nanoclusters, nanocrystals, DIAGNOSIS, NVM. Product Description popup.authors Євтух В.А. Гоменюк Ю.В. Римаренко Н.Л. Турчаніков В.І. popup.nrat_date 2020-04-02 Close