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Information × Registration Number 0213U003859, 0110U002221 , R & D reports Title Quality Control of semiconductor and composite materials by morphometrical methods and models popup.stage_title Head Bozhydarnik Viktor, Registration Date 04-02-2013 Organization Lutsk National Technical University popup.description2 New method was developed by morphometric evaluation forms particles criteria and the uniformity of their distribution, which allows to carry out a detailed analysis of the substance and identify ways to improve the characteristics of the materials. A morphometric object-oriented model of quality control for semiconductor surface, powder and composite materials was created, which includes information about the investigated object; the criteries for evaluation and a unit control was developed. A software package based on newest technologies that can be easily adapted and integrated into the production systems. Investigation of composite, semiconductor materials, powder and solar cells shown a capability of the proposed methodology, software and prototype system to solve the problems of quality control, it is allowing to get a detailed and wide range of material properties and hereunder to increase quality and productivity. Product Description popup.authors Божидарнік Віктор Володимирович Божко Андрій Володимирович Гнатюк Руслана Олексіївна Колядинський Іван Миколайович Коменда Наталія Володимирівна Коменда Тарас Іванович Коровицький Андрій Михайлович Маткова Ада Василівна Панасюк Ігор Миколайович Полівода Ніна Олександрівна Савчук Петро Петрович Ткачук Юлія Миколаївна popup.nrat_date 2020-04-02 Close