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Information × Registration Number 0213U006378, 0112U003153 , R & D reports Title Development of position - sensitive sillicon detector for x-ray difractometry of fast processes. popup.stage_title Head Pugatch Valery Mykhailovitch, Registration Date 15-05-2013 Organization Scientific Center "Institute for Nuclear Research" of National Academy of Sciences of Ukraine popup.description2 1.1. Spatial and time characteristics of several prototypes of microstrip and micropixel position sensitive detectors have been investigated on the install of speed roentgenography of fast processes at IPM NANU. 2. Unique results have been obtained using the micropixel detector TimePix (CERN, collaboration MEDIPIX) that demonstrated the possibility to observe in real time a dynamic of phase transitions in metals when they are heated or cooled. A spatial resolution of the detector (256 x 256 pixels) is 17 microns during the observation time from few tens of milliseconds to few hundreds of milliseconds. 3. High cost of such detectors can be an obstacle in the implementation of the investigated system into compact X-ray diffractometers for study. In order to find cost-effective solution of the problem characteristics of the position sensitive detectors based on micristip sensors and characteristics of different readout systems have been investigated. Preliminary results obtained using the commercial readout system "XDAS-UK" and micristrip metal detectors manufactured in INR NANU show the ability of creation of cost-effective position sensitive detector system for X- ray diffractometry of fast processes in real time. 4.2 reports on research materials have been made at international scientific forums and 1 paper has been accepted for publication in a scientific journal.5481 Product Description popup.authors Бурдін В.В. Денисюк Д.С. Ківа В.О. Ковальчук О.С. Міліція В.М. Охріменко О.Ю. Пугач М.В. Сторожик Д.І. Федорович О.А. popup.nrat_date 2020-04-02 Close