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Information × Registration Number 0213U006668, 0113U003153 , R & D reports Title High resolution Raman, nanoprobe and radiospectroscopical diagnostic of morfological, componential, structural and electrophysical properties of various nanostructures: carbonic, semiconducting, composite, colloidal and biological. popup.stage_title Head Prokopenko Igor V., Registration Date 23-12-2013 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 The methodological approaches for making submicron noncontact mapping the spatial distribution of the electrical parameters of semiconductor device structures by means of scanning probe microscopy and optical spectroscopy have been developed. The distribution of charge carriers in the epitaxial layers of semiconductor device structures were studied. Product Description popup.authors В.В.Стрельчук Литвин О.С.. Литвин П.М. Ніколенко А.С. Прокопенко І.В. popup.nrat_date 2020-04-02 Close