Search academic texts

Information × Registration Number 0214U000112, 0110U005701 , R & D reports Title Development of new method of measurement of thermal kinetic coefficients of film structures, fabrication and investigation of thermal conductivity of nanothickness multilayer film structures, testing of theoretical models. popup.stage_title Head Nikolaenko Yuriy Makarovich, Registration Date 16-01-2014 Organization A.A. Galkin Physics and Engineering Institute of National Academy of Science of the Ukraine popup.description2 The main purpose of the project is development of non-stationary method for measurement of the set of thermal kinetic coefficients of film structures. The most attention was focused on the thermal resistance of film - substrate interface, because standard equipment for investigation of this parameters is absent for the time being. The investigated objects were one-layer and multi-layer film structures. Film structures were prepared by method of magnetron sputtering of ceramics target onto single crystal substrates. The experimental findings demonstrate the possibility of control and variation of interfaces thermal resistance in multilayer film structures at the expense of crystal parameters mismatch in the case of intermediate epitaxial layers of La0.7Sr0.3MnO3 and LaAlO3, as well as for the pair of contacting materials La0.7Sr0.3MnO3 and Al2O3 with different type of crystal structure. For theoretical investigation of different factors influence on the interface thermal boundary resistance the variant of physical model in the frame of molecule dynamics approach was designed. Product Description popup.authors Артемов А.М. Ефрос Н.Б. Медведєв Ю.В. Мухін О.Б. Самольотов О.О. popup.nrat_date 2020-04-02 Close