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0214U006916,
0113U000648
,
Development of position - sensitive sillicon detector for x-ray difractometry of fast processes.
Pugatch Valery Mykhailovitch,
26-03-2014
3. Institute for Nuclear Research of National Academy of Sciences of Ukraine
For the high-speed radiography setup at IPMS NAS of Ukraine were developed and tested prototypes of different micro-detector systems with strip / pixel increment of 50 - 200 microns. Researches on micro-pixel detectors TimePix, demonstrated opportunity to observe in real time the dynamics of phase transitions in metals while heating or cooling. Positional sensitivity of the detector is 17 microns at the time of observation from a few tens of milliseconds. The characteristics of the micro-detector modules based on micro-stripe sensors and two independent readout systems based on micro-amplifiers VA-SCM3 and X-DAS were investigated. Increment of metal sensors - (10 - 200) micron; thickness - 1.2 microns. Increment of silicon sensors - (50 - 200) micron; thickness - 300 microns. Number of strips - to 1024. The developed software for automated accumulation and processing of micro-detector modules provides functionality for definition of the position of the diffraction peaks, their intensity and width as functions of temperature of the samples. The measured positional sensitivity of micro-strip detectors with strippitch of 50 microns and 200 microns equals 15 microns and 60 microns respectively, at the time of observation of 40 milliseconds. Physical researches on different samples of alloys of iron and titanium during heating / cooling using micro-detectors of vaious types were performed on the setup for radiography of transient processes at IPMS NAS Ukraine. With high accuracy (± 1.2 · 10 -3Е) were obtained the parameters of alpha and gamma phases in armco-iron within the temperature range from 20 to 1200 degrees of Celsius during the transition from ferrite to austenite. A technical specification was developed for the creation of cost-effective wide-range position sensitive detector system to provide a new level of research on the installation of high-speed transient radiography processes at IPMS NAS of Ukraine.5481
Бурдін В.В.
Денисюк Д.С.
Ківа В.О.
Ковальчук О.С.
Міліція В.М.
Охріменко О.Ю.
Панасенко Я.В.
Пугач В.М
Пугач М.В.
Пугач Т.В
Сторожик Д.І.
Федорович О.А.
2020-04-02
Updated: 2025-12-08
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