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Information × Registration Number 0214U008242, 0113U003153 , R & D reports Title High resolution Raman, nanoprobe and radiospectroscopical diagnostic of morfological, componential, structural and electrophysical properties of various nanostructures: carbonic, semiconducting, composite, colloidal and biological. popup.stage_title Head Prokopenko Igor V., Registration Date 25-12-2014 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 Methodological approaches for coplanar diagnosis of semiconductor and carbon nanostructures (quantum dots, nanatubes, graphene layers) by electric force scanning probe microscopy and confocal Raman spectroscopy techniques. The non-contact mapping of submicron distribution of electric curriers and structural parameters in semiconductor structures by means of confocal Raman spectroscopy, photoluminescent spectroscopy electrostatic and kelvin-probe microscopy. Product Description popup.authors В.В.Стрельчук Корчовий А.А. Литвин О.С.. Литвин П.М. Ніколенко А.С. Прокопенко І.В. popup.nrat_date 2020-04-02 Close