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Information × Registration Number 0215U001331, 0113U000447 , R & D reports Title Development of quantitative X-ray methods for analysis of nano-materials in the mass range from 0.1 to 100ng and nano-clusters of ~1nm size popup.stage_title Head Mikhailov Igor, Registration Date 12-02-2015 Organization The Kharkov state polytechnical university popup.description2 The object of the investigation is structure and properties of superthin coatings, diffusion and adsorbed layers of crystalline and quasi-crystalline materials including nano-structured ones. The aim of the work is development of quantitative methods for analysing the composition and structure of materials in the mass range from 0.1 to 100 ng and nano-clusters of ~1nm size. Investigation methods: X-ray fluorescent spectrometry, X-ray diffraction, X-ray reflectometry. Scientific and practical significance of the results obtained is in the development of X-ray schemes for fluorescent analysis applying the complex secondary irradiator with high sensitivity providing the detectability threshold 0.1-1 ng; creation of high stable mass standards based on thin film technology with following attestation; development of the complex scheme of X-ray fluorescent and X-ray phase analyses by the single spectrum; structure analysis of nano-cluster quasicrystals. Product Description popup.authors Бабенко Ігор Миколайович Батурін Олексій Анатолійович Борисова Світлана Серафимівна Малихін Сергій Володимирович Суровицький Сергій Вікторович Фоміна Лариса Петрівна popup.nrat_date 2020-04-02 Close