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Information × Registration Number 0215U004185, 0110U004712 , R & D reports Title Development of X-ray sources with high brightness and creation of the source based laboratory facilities for methods of micro-X-ray fluorescence analysis, micro-X-ray diffraction, X-ray computing tomography to be realized. popup.stage_title Head Buhay Oleksandr, Registration Date 13-02-2015 Organization Applied Physics Institute NAS of Ukraine popup.description2 A dynamic theory of X-ray grazing diffraction is developed for a subsurface crystal layer with defects. A diffuse scattering picture is shown to possess dynamic characteristics caused by the accurate position of Bragg reflection of either an impinging wave or a diffusely scattered wave. An X-ray source of high brightness is developed and tested as an integral part of a laboratory facility for X-ray fluorescence analysis in vacuum and atmosphere and X-ray imaging. A laboratory vacuum facility is constructed for microstructure analysis to monitor and study quick processes in powders and solid samples at deformation (extension, compression) and electrothermal heating. Product Description popup.authors Бугай Олександр Миколайович Бурдін Володимир Вікторович Гаєвський Олександр Юлійович Дрозденко Михайло Олександрович Дрозденко Олександр Олексійович popup.nrat_date 2020-04-02 Close