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Information × Registration Number 0215U006036, 0111U007957 , R & D reports Title Formation, temperature and size stability of liquid phase in nanosize eutectic systems popup.stage_title Head Kryshtal Olexandr, Registration Date 26-01-2015 Organization Kharkov National University named after V.N. Karazin popup.description2 Research object: layered Ge-Au, Ge-Al film systems with mass thickness of 2 to 60 nm on the amorphous carbon substrate. Objective: solving scientific problems of determination the physical laws governing the formation, size and thermal stability of the liquid phase in the binary layered eutectic type film systems. Research methods: sequential condensation of components in ultrahigh vacuum, transmission and scanning electron microscopy, electron diffraction, X-ray spectroscopy. A new size effect of contact melting in layered Ge-Al and Ge-Au film systems was discovered and investigated. The existence of so-called critical thickness of contact melting, i.e. the thickness of a metal film in contact with the semiconductor film, below which a liquid phase doesn't form at the eutectic temperature, was shown. Using electron microscopy, the size dependence of melting and crystallization temperatures of Ge-Au eutectic on amorphous carbon substrate was determined. The film thickness of the eutectic composition varied in the 0.3 to 60 nm range. The main results are obtained for the first time. Their relevance is beyond doubt due to both the need of understanding the physics of processes in low-dimensional systems, and extensive use of such objects in modern technologies. The results of research could be used by scientific institutions involved in similar studies. Product Description popup.authors Богатиренко С. Кришталь О. Міненков О. Сухов В. Сухов Р. popup.nrat_date 2020-04-02 Close