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Information × Registration Number 0217U003633, 0114U003736 , R & D reports Title Development and manufacturing of complex non-destructive diagnostics of chemical composition and homogeneity of materials, element base sensor systems popup.stage_title Head Valakh Mykhaylo Yakovych, Доктор фізико-математичних наук Registration Date 12-06-2017 Organization Institute of Semiconductor Physics popup.description2 During the project device for temperature studies on spectrometer DFS-52, which has been modified for micro Raman spectroscopy and for multi channel registration was designed and manufactured. The liquid nitrogen cooling system, temperature measuring system and optical system direction of the exciting laser radiation and output Raman scattered light or fluorescent emission from the surface of the samples was designed and manufactured. It was shown that registration of the Raman spectra of different types of samples while varying their temperature, can more accurately adjust the resonance conditions to enhance the intensity of Raman scattering and SERS (surface-enhanced Raman scattering) signal. This allows using of SERS substrates, previously developed by authors of the project, as sensitive sensors for ultrathin layers of molecules, not only at room temperature, but also at cryogenic temperatures. Product Description popup.authors Грещук О.М. Гуле Є.Г. Джаган В.М. Пономарьов С.С. Юхимчук В.О. popup.nrat_date 2020-04-02 Close