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Information × Registration Number 0218U006298, 0116U004144 , R & D reports Title Development and creation detection techniques of deformation in electronic devices components, non-transparent materials and mechanical constructions. popup.stage_title Head Serdega Boris Kirilovich, Registration Date 11-04-2018 Organization Institute of Semiconductor Physics popup.description2 Goal of the work was the development and creation of devices for measuring the space-time distribution of internal mechanical stresses in transparent and opaque materials and structures, also devices for the diagnosis of optical parameters (refractive index and absorption) of materials. The principle of operation of the created devices is based on the use of modulation polarimetry technique. In this case, the detectivity of the anisotropy of the dielectric properties is sufficiently large. The problem of using the ultrasensitive modulation polarimetry method for recording the phenomenon of linear and circular birefringence and pleochroism in semiconductor crystals and structures was solved. Amplitude and phase anisotropy was induced by internal (composition, structure), or external (not large temperature changes, uniaxial compression) factors. An analysis of the experimental results indicates that they are in good agreement with the calculations. This gives grounds for obtaining optical parameters and dependencies on various technological and physical factors, such as composition and topological parameters, structural properties and their relationship with the temperature regime of production. Product Description popup.authors Мінайлова Ірина Анатоліївна Міщук Олег Миколайович Максименко Лідія Степанівна Матяш Ігор Євгенович Руденко Світлана Петрівна Стеценко Максим Олександрович popup.nrat_date 2020-04-02 Close