1 documents found
Information × Registration Number 0220U000544, 0118U001876 , R & D reports Title Development and implementation of the modern analytical and metrological complex of scanning probe microscopy for intelligent technologies of materials surface engineering popup.stage_title Head Igor Prokopenko, Registration Date 02-03-2020 Organization Institute of Semiconductor Physics popup.description2 The materials (metals, polymers, nanocomposites) biocompatibility diagnostics method, based on atomic force spectroscopy of bioadhesive force interactions between functionalized nano-tip and investigated surface, is developed. The method is adapted for practical application in clinical practice dueto the use of artificial intelligence technologies in the analysis of data measured. Product Description popup.authors Єфремов О.О. Голєніщева Р.А. Гурін А.В. Корчовий А.А. Литвин О.О. Литвин П.М. Литвишко К.І. Лобортас Л.Є. Мєшкова І.А. Прокопенко І.В. popup.nrat_date 2020-07-03 Close
R & D report
Development and implementation of the modern analytical and metrological complex of scanning probe microscopy for intelligent technologies of materials surface engineering
Head: Igor Prokopenko. Development and implementation of the modern analytical and metrological complex of scanning probe microscopy for intelligent technologies of materials surface engineering. (popup.stage: ). Institute of Semiconductor Physics. № 0220U000544
1 documents found

Updated: 2026-03-27


Роздрукувати цю сторінку