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Information × Registration Number 0220U000562, 0118U006191 , R & D reports Title Creation and introduction of ultrasensitive strain gauge system on the basis of modulation polarimetry for spatial diagnostics of a stressed state in materials and structures of special purpose. popup.stage_title Head Serdega Boris Kirilovich, Registration Date 06-03-2020 Organization Institute of Semiconductor Physics popup.description2 An improved optical scheme of a polarimetric tensometer is designed to determine the spatio-time distribution of internal mechanical stresses in materials and structures for special applications. The tensometer design provides the use of a reference signal to increase sensitivity and compensation of phase incursion for registration the measured value relative to zero. The design is developed and improved mechanical-optical components of the adjusted device are made. A unit for dividing and positioning the probe beam of monochromatic radiation is made. It has the ability to change the distance between parallel linearly polarized rays and the ratio of their intensities. A block of fastening and adjusting the position of study objects is also made. It provides of structures retention with linear dimensions from 30 to 120 mm and the establishment of the perpendicularity of the sample surface and probe radiation with an accuracy of 0.05 degrees. Electronic circuits for the automatic operation complex of a high-frequency (80 kHz) tensometer have been developed and their optimal performance characteristics have been determined. The main parameters of the developed tensometer are established experimentally. The functional ability of the device allows measuring mechanical stresses with a sensitivity of 0.01 kg / cm2. Product Description popup.authors Мінайлова Ірина Анатоліївна Міщук Олег Миколайович Максименко Лідія Степанівна Матяш Ігор Євгенович Стеценко Максим Олександрович popup.nrat_date 2020-07-03 Close
R & D report
Head: Serdega Boris Kirilovich. Creation and introduction of ultrasensitive strain gauge system on the basis of modulation polarimetry for spatial diagnostics of a stressed state in materials and structures of special purpose.. (popup.stage: ). Institute of Semiconductor Physics. № 0220U000562
1 documents found

Updated: 2026-03-23