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Registration Number

0221U101384, 0120U000229 , R & D reports

Title

Development and implementation of the modern analytical and metrological complex of scanning probe microscopy for intelligent technologies of materials surface engineering

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Head

Prokopenko Ihor V.,

Registration Date

20-01-2021

Organization

VE Lashkarev Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine

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 A set of nano-metrics of physical parameters of semiconductor and hybrid nanosystems based on electrjstatic forces and current-sensing methods of scanning probe microscopy has been developed as well as the system of practical diagnostics of 2D materials, biomaterials and biological objects based on atomic force spectroscopy and artificial intelligence technologies.

Product Description

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Efremov Olexyi O.
Holenisheva Raisa A.
Hurin Andryi V.
Korchovyi Andryi A.
Lytvyn Oksana S.
Lytvyn Petro M.
Lobortas Ljudmula E.
Mechkova Iruna A.
Prokopenko Igor V

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2021-01-20