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Information × Registration Number 0221U101873, 0120U001003 , R & D reports Title Design and investigation of nanoscale multicomponent layered systems and TiZrNi quasicrystalline films popup.stage_title Head Kondratenko Valerii V, Registration Date 26-01-2021 Organization National Technical University "Kharkiv Polytechnic Institute" popup.description2 Object of study - nanoscale multilayer X-ray mirrors (MXM) Mo/Si, Mg/Si, Mg2Si/Si and Mo/B, for the manufacturing of X-ray optics and quasicrystalline Ti Zr Ni films. The aim of the work is to develop, synthesize and study the peculiarities of formation of nanoscale film compositions on the basis of new combinations of materials to create high-performance X-ray optics and nanocoatings. Methods of study - low-angle X-ray diffraction, X-ray diffraction, high-resolution electron transmission microscopy, X-ray photoelectron spectroscopy, energy dispersion spectroscopy. Nanoscale multilayer X-ray mirrors (MXM) Mg2Si/Si, Mo/B and quasicrystalline Ti - Zr - Ni deposited by direct-current magnetron sputtering were studied by methods of transmission electron microscopy and X-Ray scattering. Data on the structure, density, interlayer interaction of the layers in MXMs against the parameters of magnetron sputtering and annealing temperature were obtained. The peculiarities of the formation of mixed zones in short - period MXMs Mo/B are investigated. The change of structure and substructure parameters, as well as the content of Ti-Zr-Ni phase in isothermal vacuum annealing at a temperature of 550 ° C, as well as a result of irradiation with 5 pulses of plasma in the heat load range from 0.1 to 0.4 MJ/m2 was studied. The quasicrystalline phase was resistant to irradiation with hydrogen plasma.  Product Description popup.authors Devizenko Oleksandr Yu. Kondratenko Valeriy V Konotopsky Leonid Ye Kopylets Igor A Malykhin Sergiy V Mikhailov Igor F Pershyn Yurii P popup.nrat_date 2021-01-26 Close