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Information × Registration Number 0221U102686, 0118U001542 , R & D reports Title Development of the theory and methods of constructing means of metrological confirmation of analytical measurements popup.stage_title Head Yatsuk Vasyl O, Доктор технічних наук Registration Date 08-02-2021 Organization Lviv Polytechnic National University popup.description2 To ensure the efficiency of measurements in scattered information-measuring systems, it is proposed to use portable codecontrolled measures-simulators. It is shown that the operative control of measuring channels parameters allows to provide metrological reliability of the scattered cyberphysical systems as traditional approaches in this case practically cannot be used. It is also shown that the construction of passive quantity calibrators is associated with a significant influence of the parameters of switching elements. It is noted that the use of the simulation principle allows to increase the discreteness, accuracy and reliability and to expand the functionality of multi-valued measures of electrical resistance and impedance. Four-clamp electrical resistance measures in the low-resistance and medium-resistance subbands and coded admittance measures for operational control of impedance meters are proposed and analyzed. The analysis of errors showed that the metrological properties of imitation measures will practically be determined only by the parameters of exemplary measures of resistance, capacitance and inductance. The developed structures of coded measures of electrical resistance and complex conductivity can be implemented in microelectronic design on the basis of programmable systems on a chip. Emphasis is placed on the possibility of practical implementation of a universal portable voltage calibrator, electrical resistance to direct current and impedance with automatic error correction. Product Description popup.authors Basystiuk Iryna S Zdeb Volodymyr B Matviiv Roman O Yatsuk Yuriy V popup.nrat_date 2021-02-08 Close