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Information × Registration Number 0224U000099, 0121U112391 , R & D reports Title Features of X-ray diagnostics of nanostructure relaxation and defect formation in heterosystems with complex crystal structure, thin films and nanocomposites popup.stage_title Head Borcha Mariana D., д.ф.-м.н. Registration Date 02-01-2024 Organization Yuriy Fedkovych Chernivtsi National University popup.description2 In this paper, the concept of a multi-level approach to the creation of new methods of non-destructive structurally sensitive X-ray diagnostics of solid solutions with a complex crystal structure, thin films and multilayer nanoscale systems and near-surface layers of semiconductors exposed to external influences based on modified kinematic or generalized dynamic is developed in this work. diffraction theory taking into account the effects of diffuse scattering from existing and newly formed defects in the crystal structure. The obtained results make it possible to significantly supplement the main provisions of the generalized dynamic theory of scattering of X-rays and electrons on structural defects in complex crystalline compounds. Product Description popup.authors Balovsiak Serhii V. Mariana D. Borcha Ivan I. Hutsulyak Dovganyuk Volodymyr Vasyl'ovych Litvinchuk Taras Vasyljovych Maslyanchuk Olena L. Solodkyj Mykola Stepanovych Igor M. Fodchuk popup.nrat_date 2024-01-02 Close