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Information × Registration Number 0224U002558, 0123U103272 , R & D reports Title Development of a method based on the phenomenon of surface plasmon resonance for the study of water-based suspensions popup.stage_title Head Fedorenko Artem V., Доктор філософії Registration Date 19-02-2024 Organization V. Lashkarev Institute of Semiconductor Physics of National Academy of Sciences of Ukraine popup.description2  The water suspension of "Poliaryt" powder with various particle sizes, used in the processing of optical and electronic device components, has been investigated. The influence of different concentrations and particle sizes, achieved at various settling times of the suspension after mixing and by selectively sampling the upper layers with smaller particles, on the response of the PPR sensor was measured. The research revealed that using the PPR device to monitor suspensions containing opaque particles ranging from micrometers to nanometers in industrial conditions is relevant. Measurement results of the wear resistance of gold nano-layer sensitive elements of PPR devices during the study of "Poliaryt" water suspensions underscored the importance of this issue. This problem can be addressed by exploring and applying protective coatings of nanoscale thickness. Various technologies of applying ZnO films were tested using the Sol-gel method with zinc oxide (spin coating, bathtub) and different Sol-gel reagents to obtain films of varying thickness. ZnO films were deposited on both clean microscope glass and the sensitive element of the PPR device with a gold coating. The properties of ZnO films were investigated through spectral studies using a spectrophotometer, calculating the bandgap width of the obtained semiconductor film using the Tauc method, refractometric studies using the PPR method, surface and thickness analysis of the film using an atomic force microscope, X-ray structural analysis of the composition of the obtained films, and investigation of the electrical properties of these films. Developed methods using elastic and capacitive contacts were applied to measure the electrical conductivity of ZnO films, offering the advantages of minimal impact on the investigated surface and the ability to study highly resistive thin films. The wear resistance of sensitive elements of PPR devices with applied ZnO nanolayer was investigated, and the obtained results were c Product Description popup.authors Fedorenko Artem V. popup.nrat_date 2024-02-19 Close