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Information × Registration Number 0303U003065, 0101U002474 , R & D reports Title Stuctural defects and their influence on optical, mechanical and electrophysical properties of semiconductors popup.stage_title Дослідження впливу електронного збудження на мікромеханічні властивості напівпровідників Head Makara Volodymyr Arseniyovych, Registration Date 28-01-2003 Organization Taras Shevchenko Kiev university popup.description2 The evolution of micromechanical properties of the single-crystals silicon surface layers has been studied upon different external actions: electric and magnetic field, electric current, temperature, deformation. The correlation between dislocation mobility and microhardness of silicon crystals excited by electric current has been found and studied for the first time. In contrast to electric current magnetic field was found to cause the reversible variation of micromechanical properties. Product Description popup.authors popup.nrat_date 2020-04-02 Close