Search academic texts

Information × Registration Number 0307U001309, 0107U001250 , R & D reports Title Use of multiple dynamical X-ray diffraction for investigation of layer structures popup.stage_title Використання багатохвильової динамічної дифракції рентгенівських променів для дослідження шаруватих структур Head Fodchuk Igor Mykhaylovych, Доктор фізико-математичних наук Registration Date 09-02-2007 Organization Yuri Fedkovych Chernivtsi National University popup.description2 To estimate the strain state of real crystals and multilayer systems the theoretical basis of multiple X-ray strain measurement in multilayer structures has been origi-nated and methods of determination of strain tensor components have been devel-oped. The influence of noncoherent (diffuse) X-ray scattering on intensity distribu-tion has been investigated at multiple X-ray diffraction in multilayer systems. The algorithms and software for calculation of multiple diffractograms (at azimutal scanning) obtained for multilayer heterosystems were developed as well as for analysis and treatment of experimental data. Product Description popup.authors popup.nrat_date 2020-04-02 Close