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Mihajlov Sergej Rostislavovich. Improving of X-ray fluoroscopy systems parameters based on non-destructive testing of electron-beam device
: к.т.н. :
spec.. 05.27.02 - Вакуумна, плазмова та квантова електроніка :
presented. 2004-06-14; popup.evolution: .;
National Technscal University of Ukraine "Kiev Polytechnic Institute".. – , 0404U002475.
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Updated: 2026-03-26
