Information × Registration Number 2106U000339, Article popup.category Стаття Title popup.author popup.publication 01-01-2006 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/2087 popup.publisher Издательство СумГУ Description Ñomplex investigation of thermal stability of submicrocrystalline materials with different real structure, was carried out by X-ray diffraction in combination with transmission electron microscopy and positron annihilation spectroscopy. Structure features of submicrocrystalline Cu, Fe, Mg discovered is challenge for development of more appropriate model for X-ray diffraction evaluation. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/2087 popup.nrat_date 2025-03-31 Close
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published. 2006-01-01;
Сумський державний університет, 2106U000339