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Information × Registration Number 2112U001608, Article popup.category Thesis Title popup.author popup.publication 01-01-2012 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/35013 popup.publisher Sumy State University Description The results of research structural and phase state, electrophysical properties (resistivity, temperature coefficient of resistance (TCR), strain gauge) of Pt thin films in the range of thicknesses from 7 to 50 nm were presented. Thin films Pt have fcc structure with lattice parameter a 0,390 nm after annealing. The temperature dependences characterized by relative large value of resistivity (ρ ~ 10-6 Ohm m) and relative small value of TCR (β ~ 10-4 K-1) respectively. Strain properties characterized by a wide interval of elastic deformation (more than 1 %), relatively low value of gauge factor (1,5 – 3 units). When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35013 popup.nrat_date 2025-05-12 Close