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Information × Registration Number 2113U000517, Article popup.category Стаття Title popup.author popup.publication 01-01-2013 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/33650 popup.publisher Сумський державний університет Description According to SEM, X-ray phase analysis, Raman scattering data features of nanostructural changes in shungite carbon structure were found when processing shungite in 52 % hydrofluoric acid. It is found that conductivity increases up to the values of electrical graphite and absorption of microwave radiation also increases at frequencies up to 40 GHz, which, along with dielectric losses, is due to intense processes of both scattering at laminar carbon structures and absorption of electromagnetic energy. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33650 popup.nrat_date 2025-03-24 Close