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Information × Registration Number 2113U000602, Article popup.category Стаття Title popup.author popup.publication 01-01-2013 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/33666 popup.publisher Сумський державний університет Description By using atomic force microscopy (resolution of 40 nm) the effect of surface roughness and internal inhomogeneities on the fine structure of domain walls of different types in thin transparent orthoferrite samples cut perpendicular to the optic axis for YFeO3 and axis [001] for DyFeO3 has been studied. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33666 popup.nrat_date 2025-03-24 Close