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Information × Registration Number 2113U001335, Article popup.category Thesis Title popup.author popup.publication 01-01-2013 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/35133 popup.publisher Sumy State University Description In2Se3 thin films with different thicknesses have been deposited by thermal evaporation method on glass substrate under vacuum pressure of 10-6 Torr. Structural Properties of these films were studied by different analytical techniques. X- ray diffraction revealed as deposited films have amorphous nature and annealing effect enhanced crystalline structure. Structural studies by XRD results showed the polycrystalline nature of the films. The Full Width at Half Maximum (FWHM) values were observed from the XRD pattern and used to evaluate the microstructural parameters like crystallite size, strain, dislocation density. The optical absorption spectra of In2Se3 films were studied in the wavelength region of 250–2500 nm. The optical properties show that the band gap (Eg) values vary from 2.5 to 3.34 eV as an-nealing temperature varies from 150 to 350C. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35133 popup.nrat_date 2025-05-12 Close