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Information × Registration Number 2113U001674, Article popup.category Thesis Title popup.author popup.publication 01-01-2013 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/35334 popup.publisher Sumy State University Description Using the method of X-ray analysis with the diffraction vectors in the plane and perpendicularly to the plane of growth of nanocrystalline W-Ti-B system condensates, regularities of forming the phase composition, structure and substructural characteristics were revealed. The designer’s software package «ScecDec» was employed to process the diffraction profiles. The deposition temperature and the ratio of Ti/W atoms in the coatings were used as influential parameters. The models to describe the obtained regularities are suggested. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35334 popup.nrat_date 2025-05-12 Close