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Information × Registration Number 2114U000860, Article popup.category Стаття Title popup.author popup.publication 01-01-2014 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/36130 popup.publisher Sumy State University Description Comparison of the results of measuring the carrier recombination lifetime in silicon single crystals by contactless HF and microwave μ-PCD methods was carried out. It has been shown that HF method gives a large error compared with a μ-PCD method. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/36130 popup.nrat_date 2025-03-24 Close