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Information × Registration Number 2115U001954, Article popup.category Стаття Title popup.author popup.publication 01-01-2015 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/43188 popup.publisher Elsevier Description Polycrystalline Cd1 xZnxTe thick films with thicknesses of about 30 μm have been deposited on a Mo coated glass substrate by means of close-spaced vacuum sublimation technique. X-ray diffraction measurements have shown that the films obtained have only cubic zinc blende phase. The influence of Zn concentration on the photoluminescence (PL) spectra of Cd1 xZnxTe films was investigated. This let us determine the nature and energy structure of the intrinsic defects and residual impurities in the films. popup.nrat_date 2025-05-12 Close